Fibics

Fibics Incorporated, a privately owned company, was established by Michael W. Phaneuf, President, in early 1997 with the goal of developing applications of Focused Ion Beam (FIB) microscopy in the fields of Metallurgy and Materials Science. Since acquiring its first FIB in 1997, Fibics has developed an international reputation for its work in both metallurgy/materials science and semiconductor device modification (microsurgery) as well as in TEM specimen preparation, “nanomachining” and analysis.

Our services include:

- Micromachining and high resolution FIB sectioning and imaging of semiconductors, metallurgical specimens, and advanced materials

- Semiconductor device modification - front-side and back-side micro surgery

- Site-specific TEM sample preparation and TEM/AEM/STEM analysis

- Probe pad deposition and failure analysis